Main Page

Membership

People

Technical Activities
Board Test
Defect Tolerance
Economics of Test
Embedded Core Test
FPGA Test
Freeware Libraries
High Level D&T
IDDQ Testing
Infrastructure IP
MCM Testing
Memory Test
MEMs Testing
Mixed Signal Test
Nano-based Devices
On-Line Test
RF Test
Silicon Debug and Diagnosis
System Test
Test Education
Test Resource Partitioning
Test Synthesis
Thermal Test
Verification and Test

Tutorials and Education

Technical Meetings

Standards

Regional TTTCs

Awards

Newsletter

Home Page Directory

Monthly Planner


Technical Activity Committee
on
Embedded Core Test

TAC Chair:

Yervant Zorian, zorian@lvision.com


For information on this information server, please contact the Webmaster
This page last updated: May 30, 2004
Institute of Electrical and Electronics Engineers IEEE Computer Society