Test Technology Technical Council - Test Resource Partitioning

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Technical Activity Committee
on
Test Resource Partitioning

TAC Chair:

Yervant Zorian, zorian@lvision.com

The scope of this committee is to initiate activities to bring ATE, DFT/BIST, and EDA tool researchers and practitioners together to discuss where the best tradeoffs are for economical test of today's integrated circuits.

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This page last updated: May 30, 2004