Standards

The Test Technology Technical Council supports the development and maintenance of the following IEEE standards:

An overview of Test Technology standards

IEEE 1149.1:	Test Access Port & Boundary Scan Architecture
IEEE 1149.4:	Mixed Signal Test Bus
IEEE Standard 1149.6:	Boundary Scan Testing of Advanced Digital Networks
IEEE 1450:	Standard Tester Interface Language (STIL) for Digital Test Vector Data
IEEE P1500:	Embedded Core Test Interface (Draft Standard)
IEEE 1532:	In-System Configuration
IEEE P1581:	Static Component Interconnection

For more information about IEEE Standards, see the IEEE Standards Page.